DC biased capacitance method for measuring thin film magnetostriction and ΔE effect

Author

Lee, Y.H. ; Shin, Y.D. ; Herr, P.H. ; Lee, K.H. ; Kim, H.J. ; Han, S.H. ; Kang, I.K. ; Rhee, J.R.

Author_Institution

Phys. Dept., Jeonbuk Nat. Univ., Jeonju, South Korea

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4566

Lastpage

4568

Abstract

This paper reports a method for measuring magnetostriction, Young´s modulus of a substrate or film, and the ΔE effect with one apparatus. A substrate with a thin magnetic film deposited on it is in parallel with and cantilevered above a metal plate electrode, and they form a capacitive cell. The cantilever deflects due to its own weight and applied electric and magnetic fields. The small change of capacitance caused by this deflection is measured by a sensitive capacitance bridge. Young´s modulus, magnetostriction, and ΔE effect can be calculated by a theoretical analysis with the measured deflection data

Keywords

Young´s modulus; magnetic thin films; magnetic variables measurement; magnetostriction; ΔE effect; DC biased capacitance; Young´s modulus; capacitance bridge; magnetostriction; substrate; thin film; Bridge circuits; Capacitance measurement; Glass; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetostriction; Substrates; Transistors; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334150

Filename

334150