DocumentCode :
1200964
Title :
High-voltage management in single-supply CHE NOR-type flash memories
Author :
Motta, Ilaria ; Ragone, Giancarlo ; Khouri, Osama ; Torelli, Guido ; Micheloni, Rino
Author_Institution :
Memory Product Group, STMicroelectronics, Agrate Brianza, Italy
Volume :
91
Issue :
4
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
554
Lastpage :
568
Abstract :
In a flash memory, a number of voltage levels different from VDD are needed to perform the required operations (read, program, and erase) on the array cells. In the case of single-supply memory devices, voltages higher than VDD as well as negative voltages, which are referred to as high voltages (HVs), must be produced on-chip. This paper aims at giving the reader an overview of how HVs are generated and managed in single-supply NOR-type flash memories programmed by channel hot-electron injection. Both schemes used for conventional (i.e., bilevel) memory devices and schemes designed to meet multilevel memory requirements are addressed.
Keywords :
flash memories; hot carriers; memory architecture; storage management; bilevel memory devices; channel hot-electron injection programming; drain voltage regulation; gate voltage regulation; hierarchical decoders; high-voltage management; multilevel memory requirements; negative voltages; single-supply CHE NOR-type flash memories; single-supply memory devices; staircase gate voltage generation; standby management; Channel hot electron injection; Decoding; Flash memory; Hip; Joining processes; Logic programming; Memory management; Nonvolatile memory; Standby generators; Threshold voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2003.811706
Filename :
1199083
Link To Document :
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