Title : 
An International Direct Comparison of Two Josephson-Effect Voltage Standards
         
        
            Author : 
Hartland, Anthony ; Witt, Thomas J. ; Reymann, Dominique ; Finnegan, Thomas F.
         
        
        
        
        
        
        
            Abstract : 
A direct comparison of the Bureau International des Poids et Mesures (BIPM) and the National Physical Laboratory (NPL) Josephson-effect voltage standards has been accomplished by transporting the BIPM apparatus to the NPL during April 1978. The voltage of a saturated standard cell as measured by the BIPM system, V(BIPM), was found to differ from that measured by the NPL system, V(NPL), such that [V(BIPM) - V(NPL)]/V(BIPM) = 7 ± 2 à 10-8. This difference is 1.6 times the total expected one-standard deviation uncertainty for the combined systems. Direct comparison of the two 2e/h systems without an intermediate standard cell was also accomplished and is reported for the first time.
         
        
            Keywords : 
Detectors; Electromagnetic measurements; Frequency; Josephson junctions; Laboratories; Lead compounds; Measurement standards; Particle measurements; Transistors; Voltage measurement;
         
        
        
            Journal_Title : 
Instrumentation and Measurement, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIM.1978.4314742