• DocumentCode
    1201273
  • Title

    The testability-preserving concurrent decomposition and factorization of Boolean expressions

  • Author

    Rajski, Janusz ; Vasudevamurthy, Jagadeesh

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    11
  • Issue
    6
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    778
  • Lastpage
    793
  • Abstract
    The authors present a concurrent method for the decomposition and factorization of Boolean expressions. The method uses only two-literal single-cube divisors and double-cube divisors considered concurrently with their complements. The authors demonstrate that these objects, despite their simplicity, provide a very good framework on which to reason about common algebraic divisors and the duality relations between expressions. The simplicity of these objects makes it possible to compute the cost function associated with them accurately and dynamically. Hence, the method is entirely greedy, and in each iteration it extracts the best expression along with its complement. The decomposition is based on testability-preserving transformations, and the synthesized multilevel network is fully tested by a complete test derived for the original circuit. The algorithm has been implemented and excellent results on several benchmark circuits illustrate its efficiency and effectiveness
  • Keywords
    Boolean algebra; logic design; logic testing; many-valued logics; minimisation of switching nets; Boolean expressions; concurrent method; decomposition; double-cube divisors; factorization; logic minimisation; logic synthesis; multilevel network; single-cube divisors; testability-preserving transformations; Associate members; Benchmark testing; Boolean functions; Circuit synthesis; Circuit testing; Cost function; Equations; Logic testing; Minimization; Network synthesis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.137523
  • Filename
    137523