Title :
Testability measures in pseudorandom testing
Author :
Ercolani, S. ; Favalli, M. ; Damiani, M. ; Olivo, P. ; Ricco, B.
Author_Institution :
DEIS, Bologna Univ., Italy
fDate :
6/1/1992 12:00:00 AM
Abstract :
The authors present two methods for computing the fault detection probabilities in combinational networks. The methods provide a deeper insight into the effects of signal correlations caused by multiple fan-out reconvergencies and can be used in testability analysis to predict the fault coverage of pseudorandom patterns. The performances of these algorithms have been tested on significant benchmarks and compare favorably with those of previous procedures
Keywords :
combinatorial circuits; fault location; logic testing; probability; combinational networks; fault coverage; fault detection probabilities; logic circuits; multiple fan-out reconvergencies; pseudorandom patterns; pseudorandom testing; signal correlations; testability analysis; Algorithm design and analysis; Circuit faults; Circuit simulation; Circuit testing; Controllability; Costs; Electrical fault detection; Fault detection; Observability; Probability;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
