Application-independent testing of FPGA interconnects

Author

Tahoori, Mehdi Baradaran ; Mitra, Subhasish

Author_Institution

Center for Reliable Comput., Stanford Univ., CA, USA

Volume

24

Issue

11

fYear

2005

Firstpage

1774

Lastpage

1783

Abstract

We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.

Keywords

automatic test pattern generation; fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; FPGA interconnect testing; Xilinx Virtex FPGA; application-independent manufacturing testing; application-independent testing; automatic test-configuration-generation; bridging faults; fault detection; interconnection network testing; open faults; static-random-access-memory-based field programmable gate arrays; stuck-closed faults; stuck-open faults; Automatic testing; Circuit faults; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Programmable logic arrays; Routing; Switches; Wires; Field programmable gate arrays (FPGAs); interconnections; self-testing; testing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2005.852452

Filename

1522443