An Automated Test Set for High Resolution Analog-to-Digital and Digital-to-Analog Converters

An automated test set is described for characterizing the static performance of high resolution ADC´s and DAC´s. Measured parameters include gain, offset, linearity, and equivalent ADC input noise with uncertainties of 2-4 ppm. Measurements to full accuracy can be made at a rate up to 40/s. A 20-bit DAC serves as a comparison standard.