Title :
In/sub 0.53/Ga/sub 0.47/As junction field-effect transistors as tunable feedback resistors for integrated receiver preamplifiers
Author :
Brown, J.J. ; Lo, D.C.W. ; Gardner, J.T. ; Chung, Y.K. ; Lee, C.D. ; Forrest, Stephen R.
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
In/sub 0.53/Ga/sub 0.47/As active feedback junction field-effect transistors (JFETs) for use in integrated transimpedance photoreceivers are discussed. By varying the gate-to-source voltage V/sub GS/, the resistance can be continuously tuned between 3 and 40 k Omega with a drain-to-source capacitance of <10 fF. The temperature coefficient of resistance is between -5 and -20 Omega / degrees C (for V/sub GS/ less than the pinch-off voltage). The combination of large resistance and low capacitance can result in high receiver sensitivity without sacrificing amplifier dynamic range. The feedback FET was fabricated adjacent to 1.8- mu m-gate-length JFETs with transconductances of 110 mS/mm, gate-to-source capacitances of 1.3 pF/mm, and DC amplifier voltage gains of 100. The compatibility of these transistor structures indicates that an integrated preamplifier with dynamically tunable bandwidth can be realized.<>
Keywords :
III-V semiconductors; feedback; gallium arsenide; indium compounds; junction gate field effect transistors; optical communication equipment; preamplifiers; receivers; resistors; tuning; 10 fF; 3 to 40 kohm; DC amplifier voltage gains; In/sub 0.53/Ga/sub 0.47/As; TCR; active feedback JFETs; drain-to-source capacitance; dynamically tunable bandwidth; feedback FET; gate-to-source capacitances; integrated receiver preamplifiers; integrated transimpedance photoreceivers; junction field-effect transistors; receiver sensitivity; semiconductors; temperature coefficient of resistance; transconductances; tunable feedback resistors; Bandwidth; FETs; Feedback; Materials science and technology; Optical noise; Optical receivers; Parasitic capacitance; Preamplifiers; Resistors; Voltage;
Journal_Title :
Electron Device Letters, IEEE