Title :
A new SPICE subcircuit model of power p-i-n diode
Author :
Strollo, Antonio G M
Author_Institution :
Dipartimento di Ingegneria Elettronica, Naples Univ., Italy
fDate :
11/1/1994 12:00:00 AM
Abstract :
A new modeling approach for the power p-i-n diode is proposed. The base region is represented with a two-port network, obtained by solving the ambipolar diffusion equation with the Laplace transform method, and by approximating the resulting transcendental functions in the s-domain with rational approximations. Two different networks have been obtained. The first one, based on Taylor-series approximation is shown to be a generalization of a two-port model already proposed in the literature for the nonquasi-static modeling of bipolar transistors. The second network representation is based on Pade´ approximation and is shown to be more accurate than the Taylor-series approach, The obtained RLC networks are easily implemented in a PSPICE subcircuit which also takes into account the emitter recombination effects and the dynamic of the space-charge voltage build-up. Good agreement has been obtained by comparing the results of the proposed model with numerical device simulations
Keywords :
Laplace transforms; SPICE; approximation theory; circuit analysis computing; diffusion; digital simulation; p-i-n diodes; power engineering computing; power semiconductor diodes; semiconductor device models; series (mathematics); space charge; two-port networks; Laplace transform method; PSPICE subcircuit model; Pade´ approximation; RLC networks; Taylor series; ambipolar diffusion equation; base region; emitter recombination effects; generalization; modeling approach; nonquasi-static modeling; numerical device simulations; power p-i-n diode; rational approximations; s-domain; space-charge voltage build-up dynamic; transcendental functions; two-port network; Bipolar transistors; Circuit simulation; Helium; Laplace equations; Numerical models; Numerical simulation; P-i-n diodes; RLC circuits; SPICE; Voltage;
Journal_Title :
Power Electronics, IEEE Transactions on