Author :
Afsar, M.N. ; Bellemans, A. ; Birch, J.R. ; Chantry, G.W. ; Clarke, R.N. ; Cook, R.J. ; Finsy, R. ; Göttman, O. ; Goulon, J. ; Jones, R.G. ; Kaatze, U. ; Kestemont, E. ; Kilp, H. ; Mandel, M. ; Pottel, R. ; Rivail, J-L. ; Rosenberg, C.B. ; van Loon, R.
Abstract :
From measurements on hyperpure and commercially pure low- to high-loss liquids over a wide spectral range and using a variety of experimental equipment, we have been able for the first time to quantify both the systematic and the random uncertainties to which extra-high-frequency dielectric measurements are subject. From our measurements it has become possible to specify certain liquids and solids as standard reference materials for the calibration of high-frequency dielectric measuring equipment.
