Title :
Picosecond measurements by free-running electro-optic sampling
Author :
Giboney, Kirk S. ; Allen, Scott T. ; Rodwell, Mark J.W. ; Bowers, John E.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
Timing jitter in passively mode-locked lasers is an important limit in electro-optic measurements. We demonstrate picosecond resolution electro-optic sampling measurements in the presence of nanosecond-scale timing jitter. Timing-jitter distortion is eliminated by scanning at a large offset frequency and triggering on the resulting waveform. Frequency jitter and the effects of triggering on a noisy signal are analyzed. Using this method, 1.5 ps fall times are measured on electronically generated shock waveforms.<>
Keywords :
electro-optical modulation; high-speed optical techniques; jitter; laser mode locking; laser noise; measurement by laser beam; 1.5 ps; electro-optic measurements; electronically generated shock waveforms; fall times; free-running electro-optic sampling; large offset frequency; nanosecond-scale timing jitter; noisy signal; passively mode-locked lasers; picosecond measurements; picosecond resolution electro-optic sampling measurements; timing jitter; timing-jitter distortion; Distortion measurement; Electric shock; Frequency; Laser mode locking; Laser noise; Lasers and electrooptics; Sampling methods; Signal analysis; Signal resolution; Timing jitter;
Journal_Title :
Photonics Technology Letters, IEEE
