DocumentCode
1203193
Title
Active resource allocation for active reliable multicast
Author
Feng, G. ; Siew, C.K. ; Yeung, K.L.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume
150
Issue
2
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
69
Lastpage
79
Abstract
Local loss recovery for reliable multicast can provide significant performance improvement in terms of loss recovery latency, bandwidth consumption and network throughput. Active reliable multicast (ARM) is a novel loss recovery scheme for large-scale reliable multicast. When sufficient active resources of active routers (ARs) and associated cache are available, ARM gives good loss recovery latency performance. The authors build an analytical model for studying the optimal active resource allocation for ARM. They propose a top-down layering analysis (TDLA) approach to derive the expected loss recovery latency (ELRL). For a given multicast tree, the ELRL is derived as a function of the active resource allocation pattern. Simulation experiments reveal that high performance gains can be attained with limited active resources, which are properly allocated. It is also shown that simulation results have a good match with the analytical results. The analytical framework developed can be used for further investigation of various active resource allocation schemes and caching policies.
Keywords
delays; multicast protocols; queueing theory; resource allocation; telecommunication network reliability; telecommunication network routing; transport protocols; FIFO; IP-multicast routing; active reliable multicast; active resource allocation; active resource allocation pattern; active routers; analytical model; bandwidth consumption; caching policies; expected loss recovery latency; first-in-first-out discipline; large-scale reliable multicast; latency performance; local loss recovery; loss recovery; loss recovery latency; multicast tree; network throughput; optimal active resource allocation; reliable multicast protocols; simulation experiments; simulation results; top-down layering analysis;
fLanguage
English
Journal_Title
Communications, IEE Proceedings-
Publisher
iet
ISSN
1350-2425
Type
jour
DOI
10.1049/ip-com:20030179
Filename
1199806
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