Wide-Band Device Modeling Using Time-Domain Reflectometry

A method is presented for modeling wide-band devices. The method is based on the time-domain reflectometry technique, using computer simulation to improve the modeling accuracy. Two applications are presented. The first involves modeling of simple line discontinuities to demonstrate the technique as well as to verify its validity. The second application presents the modeling of a multiple discontinuity feedthrough line of a wide-band sampler.