Title :
An Automatic Test Set for the Dynamic Characterization of A/D Converters
Author :
Souders, T. Michael ; Flach, Donald R. ; Wong, Thick C.
fDate :
3/1/1983 12:00:00 AM
Abstract :
An automatic test set is described for measuring the dynamic characteristics of A/D converters having up to 16 bits of resolution. The test converter is exercised with stepped input changes typical of the conditions of actual use. All dynamic test parameters are under program control, making it possible to separate and measure dynamic errors of various sources. Typical test results are included.
Keywords :
Automatic control; Automatic testing; Calibration; Error correction; NIST; Signal processing; Signal resolution; System testing; Thickness measurement; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1983.4315037
