• DocumentCode
    1203632
  • Title

    An Automatic Test Set for the Dynamic Characterization of A/D Converters

  • Author

    Souders, T. Michael ; Flach, Donald R. ; Wong, Thick C.

  • Volume
    32
  • Issue
    1
  • fYear
    1983
  • fDate
    3/1/1983 12:00:00 AM
  • Firstpage
    180
  • Lastpage
    186
  • Abstract
    An automatic test set is described for measuring the dynamic characteristics of A/D converters having up to 16 bits of resolution. The test converter is exercised with stepped input changes typical of the conditions of actual use. All dynamic test parameters are under program control, making it possible to separate and measure dynamic errors of various sources. Typical test results are included.
  • Keywords
    Automatic control; Automatic testing; Calibration; Error correction; NIST; Signal processing; Signal resolution; System testing; Thickness measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1983.4315037
  • Filename
    4315037
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1203632