Title :
The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field
Author :
Ten Haken, B. ; van de Klundert, L.J.M. ; Vysotsky, V.S. ; Karasik, V.R.
Author_Institution :
Appl. Superconductivity Center, Twente Univ., Enschede, Netherlands
fDate :
1/1/1992 12:00:00 AM
Abstract :
With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape
Keywords :
critical currents; electric current measurement; niobium alloys; superconducting devices; titanium alloys; type II superconductors; 20 micron; NbTi tape; critical current; current reduction; magnetic field; one-dimensional model; self field; superconducting thermal switch; Conducting materials; Conductors; Critical current; Current measurement; Magnetic field measurement; Niobium compounds; Superconducting films; Superconducting materials; Switches; Titanium compounds;
Journal_Title :
Magnetics, IEEE Transactions on
