DocumentCode
1204173
Title
An overview of high-temperature electronic device technologies and potential applications
Author
Dreike ; Fleetwood, D.M. ; King, D.B. ; Sprauer, D.C. ; Zipperian, T.E.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
17
Issue
4
fYear
1994
fDate
12/1/1994 12:00:00 AM
Firstpage
594
Lastpage
609
Abstract
High-temperature electronics applications are found in combustion systems, well logging, and industrial processes, air stagnation points in supersonic aircraft, vehicle brakes, nuclear reactors, and dense electronic packages. We summarize physical effects and materials issues important for reliable operation of semiconductor device technologies at high temperatures (>125°C). We review the high-temperature potential of Si, GaAs, other III-V compounds, and SiC. For completeness, we also comment on nitrides, diamond, and vacuum microelectronics. We conclude that Si on insulator (SOI) technology can be developed readily for small signal operation up to about 300°C. There is some ongoing work in this area. GaAs offers little advantage over Si because of poor device isolation and the lack of reliable contacts above 250°C. Other III-V compounds could be developed for operation to ~600°C, using processes similar to those used for optoelectronics. There may be a market niche for III-V power devices above 200°C. There is considerable activity in semiconducting SiC, and device functionality has been demonstrated above 600°C. SiC is promising for operation above 300°C, and for power devices at frequencies from dc to ~10 GHz, but it faces numerous challenges to achieve manufacturable status. We attempt to match technologies with application areas
Keywords
power semiconductor devices; radiation hardening (electronics); semiconductor technology; vacuum microelectronics; 200 to 600 degC; GaAs; III-V compounds; Si; SiC; aircraft; combustion systems; dense electronic packages; device functionality; device isolation; high-temperature electronic device technologies; industrial processes; nuclear reactors; power devices; semiconductor device technologies; small signal operation; vacuum microelectronics; vehicle brakes; well logging; Aerospace electronics; Aerospace industry; Combustion; Consumer electronics; Gallium arsenide; III-V semiconductor materials; Industrial electronics; Nuclear electronics; Silicon carbide; Well logging;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher
ieee
ISSN
1070-9886
Type
jour
DOI
10.1109/95.335047
Filename
335047
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