• DocumentCode
    1204173
  • Title

    An overview of high-temperature electronic device technologies and potential applications

  • Author

    Dreike ; Fleetwood, D.M. ; King, D.B. ; Sprauer, D.C. ; Zipperian, T.E.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    17
  • Issue
    4
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    594
  • Lastpage
    609
  • Abstract
    High-temperature electronics applications are found in combustion systems, well logging, and industrial processes, air stagnation points in supersonic aircraft, vehicle brakes, nuclear reactors, and dense electronic packages. We summarize physical effects and materials issues important for reliable operation of semiconductor device technologies at high temperatures (>125°C). We review the high-temperature potential of Si, GaAs, other III-V compounds, and SiC. For completeness, we also comment on nitrides, diamond, and vacuum microelectronics. We conclude that Si on insulator (SOI) technology can be developed readily for small signal operation up to about 300°C. There is some ongoing work in this area. GaAs offers little advantage over Si because of poor device isolation and the lack of reliable contacts above 250°C. Other III-V compounds could be developed for operation to ~600°C, using processes similar to those used for optoelectronics. There may be a market niche for III-V power devices above 200°C. There is considerable activity in semiconducting SiC, and device functionality has been demonstrated above 600°C. SiC is promising for operation above 300°C, and for power devices at frequencies from dc to ~10 GHz, but it faces numerous challenges to achieve manufacturable status. We attempt to match technologies with application areas
  • Keywords
    power semiconductor devices; radiation hardening (electronics); semiconductor technology; vacuum microelectronics; 200 to 600 degC; GaAs; III-V compounds; Si; SiC; aircraft; combustion systems; dense electronic packages; device functionality; device isolation; high-temperature electronic device technologies; industrial processes; nuclear reactors; power devices; semiconductor device technologies; small signal operation; vacuum microelectronics; vehicle brakes; well logging; Aerospace electronics; Aerospace industry; Combustion; Consumer electronics; Gallium arsenide; III-V semiconductor materials; Industrial electronics; Nuclear electronics; Silicon carbide; Well logging;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.335047
  • Filename
    335047