• DocumentCode
    1204816
  • Title

    Design of CMOS self-checking sequential circuits with improved detectability of bridging faults

  • Author

    Metra, C. ; Favalli, Michele ; Ricco, Bruno

  • Author_Institution
    DEIS, Bologna Univ.
  • Volume
    30
  • Issue
    23
  • fYear
    1994
  • fDate
    11/10/1994 12:00:00 AM
  • Firstpage
    1934
  • Lastpage
    1936
  • Abstract
    Problems due to the presence of resistive bridging faults within sequential functional blocks of self-checking circuits are studied, and design criteria aimed at reducing their effects are proposed
  • Keywords
    CMOS logic circuits; built-in self test; design for testability; fault location; integrated circuit testing; logic design; logic testing; sequential circuits; BIST; CMOS sequential circuits; bridging fault detection; design criteria; fault detectability; resistive bridging faults; self-checking circuits; sequential functional block;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19941351
  • Filename
    335664
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1204816