DocumentCode :
1205056
Title :
A 16 Gb/s/Link, 64 GB/s Bidirectional Asymmetric Memory Interface
Author :
Lee, Haechang ; Chang, Kun-Yung Ken ; Chun, Jung-Hoon ; Wu, Ting ; Frans, Yohan ; Leibowitz, Brian ; Nguyen, Nhat ; Chin, T.J. ; Kaviani, Kambiz ; Shen, Jie ; Shi, Xudong ; Beyene, Wendemagegnehu T. ; Li, Simon ; Navid, Reza ; Aleksic, Marko ; Lee, Fred S
Author_Institution :
Rambus Inc., Los Altos, CA
Volume :
44
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
1235
Lastpage :
1247
Abstract :
This paper describes a bidirectional, differential, 16 Gb/s per link memory interface that includes a Controller and an emulated DRAM physical interface (PHY) designed in 65 nm CMOS. To achieve high data rate, the interface employs the following technology ingredients: asymmetric equalization, asymmetric timing calibration, asymmetric link margining, inductor based (LC) PLLs, multi-phase error correction, and a data dependent regulator. At 16 Gb/s, this interface achieves a unit-interval to inverter FO4 ratio of 2.8 (Controller) and 1.4 (DRAM) and operates in a channel with 15 dB loss at Nyquist. Under such bandwidth limitations on and off chip, the Controller and DRAM PHYs consume 13 mW/Gb/s and 8 mW/Gb/s, respectively. Using PRBS 211-1, the link achieves a timing margin of 0.19 UI at a BER of 1e-12 for both read and write operations.
Keywords :
CMOS memory circuits; DRAM chips; calibration; error correction; phase locked loops; timing; CMOS; DRAM physical interface; asymmetric equalization; asymmetric link margining; asymmetric timing; bidirectional asymmetric memory interface; calibration; data dependent regulator; inductor based PLL; loss 15 dB; multi-phase error correction; size 65 nm; Bandwidth; CMOS technology; Calibration; Error correction; Inductors; Inverters; Physical layer; Random access memory; Regulators; Timing; CMOS memory integrated circuits; DRAM chips; equalizers; high-speed integrated circuits; interconnections; intersymbol interference; jitter; synchronization; transceivers;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2014199
Filename :
4804996
Link To Document :
بازگشت