Analog Modeling Improves Test Programs

The complexity of integrated circuits has increased to the point that the integrated circuit´s (IC) internal circuit components affect the ability of in-circuit testers to accurately measure analog components connected externally to the IC. For analog circuit analyzers, the ability to describe the IC´s internal electrical equivalent using standard components, R, L, C, etc., improves the automatic analog test program generator´s ability to add guards to offset the internal shunts. This article presents a technique for selecting and describing basic component types and component magnitudes within the IC´s internal structure.