• DocumentCode
    1205167
  • Title

    Heavily cold worked high-purity Ta as a reinforcing stabilizer

  • Author

    Matsukawa, M. ; Noto, K. ; Katagiri, K. ; Matsuura, N. ; Ikebe, M. ; Takahashi, C. ; Fukutsuka, T. ; Watanabe, K.

  • Author_Institution
    Fac. of Eng., Iwate Univ., Morioka, Japan
  • Volume
    28
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    880
  • Lastpage
    883
  • Abstract
    Mechanical and electrical properties have been studied for a heavily cold-worked high-purity Ta wire. Tensile test at room temperature shows a large 0.2% proof stress of about 70 kg/mm2, which is probably caused by work-hardening in the wire drawing process. Observations of fracture surfaces using a scanning electron microscope indicate that this material is very ductile. Moreover, this sample has a low resistivity of about 0.4 μΩ-cm even at the high field of 15 T. The residual resistivity ratio is about 80, which is consistent with the high purity of the sample. Therefore, it has been found that the cold-worked Ta wire is applicable to a reinforcing stabilizer for conductors of large-scale and/or high-field superconducting magnets
  • Keywords
    cold working; drawing (mechanical); ductility; electrical conductivity of crystalline metals and alloys; fracture; scanning electron microscope examination of materials; superconducting magnets; tantalum; tensile strength; work hardening; 0.4 muohmcm; 15 T; Ta; ductility; electrical properties; fracture surfaces; heavy cold working; high-purity Ta wire; low resistivity; proof stress; reinforcing stabilizer; residual resistivity ratio; scanning electron microscope; superconducting magnets; tensile test; wire drawing process; work-hardening; Conductivity; Conductors; Large-scale systems; Mechanical factors; Scanning electron microscopy; Surface cracks; Temperature distribution; Tensile stress; Testing; Wire drawing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.120019
  • Filename
    120019