DocumentCode
1205285
Title
Short-Term Frequency Stability of Relaxation Crystal Oscillators
Author
Vasiljevic, Dragan M.
Volume
33
Issue
4
fYear
1984
Firstpage
315
Lastpage
322
Abstract
Due to the need for stable frequency rectangular wave signals, various relaxation quartz crystal oscillators were designed. Therefore it is of interest to have data on their short-term frequency stability. The generally accepted definitions of measures for short-term frequency stability and measurement procedures are reviewed in this paper. Measurement results for the short-term frequency stability of quartz crystal multivibrators in time and frequency domains show a high spectral purity of the multivibrator output signal. The single-sideband-to-carrier phase noise has values lower than -90 and -120 dB on the offset frequencies of 1 and 10 Hz, respectively. The white phase noise is about -160 dB. The power law spectral density model of fractional frequency fluctuations for the quartz multivibrators is established and a discussion on the noise sources is given.
Keywords
1f noise; Counting circuits; Fluctuations; Frequency domain analysis; Frequency measurement; Oscillators; Phase measurement; Phase noise; Stability; Time measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1984.4315231
Filename
4315231
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