DocumentCode :
1205418
Title :
Dielectric Thickness Measurement Employing Heterodyne Technique
Author :
Saadallah, S. ; Allos, J.E. ; Daher, R.H.
Issue :
1
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
17
Lastpage :
21
Abstract :
A microwave system for measuring the thickness of dielectric materials employing the heterodyne technique is described. Calibration curves relating the dc output voltage and dielectric thickness are presented for leather, glass, and cartons. The system was operated at 9 GHz. The experimental results illustrate the suitability of the technique for industrial applications.
Keywords :
Dielectric materials; Dielectric measurements; Frequency conversion; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Phase measurement; Reactive power; Thickness measurement; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1985.4315248
Filename :
4315248
Link To Document :
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