DocumentCode :
1205496
Title :
Very noisy channels, reliability functions, and exponentially optimum codes
Author :
Lee, Sangmin ; Winick, Kim A.
Author_Institution :
Dept. of Electron. Eng., Kang Nung Nat. Univ., Kangwondo, South Korea
Volume :
40
Issue :
3
fYear :
1994
fDate :
5/1/1994 12:00:00 AM
Firstpage :
647
Lastpage :
661
Abstract :
A very noisy channel (VNC), is a discrete-input memoryless channel whose capacity is close to zero. Very noisy channels are of interest, since they serve as models for some important physical channels. There are two distinct classes of VNCs: Reiffen´s class I (Reiffen, 1963) and Majani´s class II (Majani, 1987). It is shown that the reliability function is known exactly for both classes of VNCs, by extending the results previously obtained only for class I. It is then shown that an exponentially optimum code can be constructed for a channel if it can be modeled as repeated uses of a binary-input class I VNC, a binary-input/binary-output class II VNC or a class II very noisy binary erasure channel. The theory developed is illustrated by considering the direct detection optical channel used with polarization modulation. The capacity, reliability function, and exponentially optimum code, for this channel, are derived
Keywords :
channel capacity; codes; optimisation; random noise; reliability; Majani´s class II channel; Reiffen´s class I channel; binary-input class I channel; binary-input/binary-output class II channel; capacity; class II very noisy binary erasure channel; direct detection optical channel; discrete-input memoryless channel; exponentially optimum codes; polarization modulation; reliability functions; very noisy channel; AWGN; Additive white noise; Area measurement; Channel capacity; Energy measurement; Gaussian noise; Network address translation; Optical detectors; Optical noise; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/18.335878
Filename :
335878
Link To Document :
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