• DocumentCode
    1205496
  • Title

    Very noisy channels, reliability functions, and exponentially optimum codes

  • Author

    Lee, Sangmin ; Winick, Kim A.

  • Author_Institution
    Dept. of Electron. Eng., Kang Nung Nat. Univ., Kangwondo, South Korea
  • Volume
    40
  • Issue
    3
  • fYear
    1994
  • fDate
    5/1/1994 12:00:00 AM
  • Firstpage
    647
  • Lastpage
    661
  • Abstract
    A very noisy channel (VNC), is a discrete-input memoryless channel whose capacity is close to zero. Very noisy channels are of interest, since they serve as models for some important physical channels. There are two distinct classes of VNCs: Reiffen´s class I (Reiffen, 1963) and Majani´s class II (Majani, 1987). It is shown that the reliability function is known exactly for both classes of VNCs, by extending the results previously obtained only for class I. It is then shown that an exponentially optimum code can be constructed for a channel if it can be modeled as repeated uses of a binary-input class I VNC, a binary-input/binary-output class II VNC or a class II very noisy binary erasure channel. The theory developed is illustrated by considering the direct detection optical channel used with polarization modulation. The capacity, reliability function, and exponentially optimum code, for this channel, are derived
  • Keywords
    channel capacity; codes; optimisation; random noise; reliability; Majani´s class II channel; Reiffen´s class I channel; binary-input class I channel; binary-input/binary-output class II channel; capacity; class II very noisy binary erasure channel; direct detection optical channel; discrete-input memoryless channel; exponentially optimum codes; polarization modulation; reliability functions; very noisy channel; AWGN; Additive white noise; Area measurement; Channel capacity; Energy measurement; Gaussian noise; Network address translation; Optical detectors; Optical noise; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/18.335878
  • Filename
    335878