DocumentCode :
1205509
Title :
Electromagnetic behaviour of bulk textured YBaCuO
Author :
Winter, V. ; Hermann, P.F. ; Agnoux, C. ; Leriche, A. ; Mautref, M. ; Grivon, F. ; Fevier, A. ; de Rango, P.
Author_Institution :
Alcatel Alsthom Recherche, Marcoussis, France
Volume :
28
Issue :
1
fYear :
1992
fDate :
1/1/1992 12:00:00 AM
Firstpage :
892
Lastpage :
895
Abstract :
Electrical and magnetic results obtained on bulk YBaCuO samples manufactured by the melt textured growth process are reported. These studies are important for understanding the limitation mechanisms of transport current. Transport critical current densities in excess of 2.5×108 A/m2 have been measured in a field of 2 T at 77 K in oriented YBaCuO. The critical state concept for the calculation of internal flux profiles is used to model the magnetization behavior of textured materials. Magnetization measurements are compared with theoretical curves for different orientations of the magnetic field with respect to crystallographic axes. This study makes it possible to determine inductive critical current densities which are strongly influenced by the current path geometry. The results are compared to transport Jct values. Self-field loss values are also presented
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; losses; magnetisation; texture; yttrium compounds; bulk textured YBaCuO; critical current densities; critical state concept; current path geometry; high temperature superconductor; internal flux profiles; magnetization behavior; melt textured growth; self field loss; transport current limitation mechanisms; Critical current density; Crystalline materials; Current measurement; Density measurement; Magnetic field measurement; Magnetic flux; Magnetic materials; Magnetization; Manufacturing processes; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.120022
Filename :
120022
Link To Document :
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