DocumentCode
1206090
Title
A modified k-means algorithm for circular invariant clustering
Author
Charalampidis, Dimitrios
Author_Institution
Dept. of Electr. Eng., New Orleans Univ., LA, USA
Volume
27
Issue
12
fYear
2005
Firstpage
1856
Lastpage
1865
Abstract
Several important pattern recognition applications are based on feature vector extraction and vector clustering. Directional patterns are commonly represented by rotation-variant vectors Fd formed from features uniformly extracted in M directions. It is often desirable that pattern recognition algorithms are invariant under pattern rotation. This paper introduces a distance measure and a k-means-based algorithm, namely, circular k-means (CK-means) to cluster vectors containing directional information, such as Fd, in a circular-shift invariant manner. A circular shift of Fd corresponds to pattern rotation, thus, the algorithm is rotation invariant. An efficient Fourier domain representation of the proposed measure is presented to reduce computational complexity. A split and merge approach (SMCK-means), suited to the proposed CK-means technique, is proposed to reduce the possibility of converging at local minima and to estimate the correct number of clusters. Experiments performed for textural images illustrate the superior performance of the proposed algorithm for clustering directional vectors Fd, compared to the alternative approach that uses the original k-means and rotation-invariant feature vectors transformed from Fd.
Keywords
Fourier analysis; feature extraction; pattern clustering; Fourier domain representation; circular invariant clustering; feature vector extraction; modified k-means algorithm; pattern recognition; pattern rotation; vector clustering; Biomedical imaging; Clustering algorithms; Computational complexity; Data mining; Discrete Fourier transforms; Feature extraction; Image converters; Image segmentation; Object recognition; Pattern recognition; Index Terms- Clustering; algorithms; similarity measures.; Algorithms; Artificial Intelligence; Cluster Analysis; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Signal Processing, Computer-Assisted;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2005.230
Filename
1524980
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