Title :
Where are linear feature extraction methods applicable?
Author :
Martinez, Aleix M. ; Zhu, Manli
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
A fundamental problem in computer vision and pattern recognition is to determine where and, most importantly, why a given technique is applicable. This is not only necessary because it helps us decide which techniques to apply at each given time. Knowing why current algorithms cannot be applied facilitates the design of new algorithms robust to such problems. In this paper, we report on a theoretical study that demonstrates where and why generalized eigen-based linear equations do not work. In particular, we show that when the smallest angle between the ith eigenvector given by the metric to be maximized and the first i eigenvectors given by the metric to be minimized is close to zero, our results are not guaranteed to be correct. Several properties of such models are also presented. For illustration, we concentrate on the classical applications of classification and feature extraction. We also show how we can use our findings to design more robust algorithms. We conclude with a discussion on the broader impacts of our results.
Keywords :
computer vision; eigenvalues and eigenfunctions; feature extraction; computer vision; eigenvector; linear feature extraction method; pattern recognition; Algorithm design and analysis; Covariance matrix; Eigenvalues and eigenfunctions; Equations; Feature extraction; Linear discriminant analysis; Pattern recognition; Robustness; Scattering; Symmetric matrices; Index Terms- Feature extraction; classifiers; generalized eigenvalue decomposition; pattern recognition.; performance evaluation; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Linear Models; Models, Statistical; Pattern Recognition, Automated;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.250