Title :
Face recognition using face-ARG matching
Author :
Park, Bo-Gun ; Lee, Kyoung-Mu ; Lee, Sang-Uk
Author_Institution :
Digital Media R&D Center, Samsung Electron. Co., Ltd., Suwon, South Korea
Abstract :
In this paper, we propose a novel line feature-based face recognition algorithm. A face is represented by the face-ARG model, where all the geometric quantities and the structural information are encoded in an attributed relational graph (ARG) structure, then the partial ARG matching is done for matching face-ARG´s. Experimental results demonstrate that the proposed algorithm is quite robust to various facial expression changes, varying illumination conditions and occlusion, even when a single sample per person is given.
Keywords :
computer graphics; face recognition; feature extraction; attributed relational graph structure; face recognition; face-ARG matching; line feature recognition; occlusion; Computer vision; Face recognition; Facial features; Image recognition; Lighting; Principal component analysis; Robustness; Shape; Solid modeling; Stochastic processes; Index Terms- ARG matching; face recognition; stochastic analysis.; structural representation; Algorithms; Artificial Intelligence; Computer Simulation; Face; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Biological; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.243
