• DocumentCode
    1206202
  • Title

    Application of the Quantized Hall Effect to a New Resistance Standard at VSL

  • Author

    Van Der Wel, W. ; Harmans, Kees J.P.M. ; Kaarls, Robert ; Mooij, J.E.

  • Issue
    2
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    314
  • Lastpage
    316
  • Abstract
    A description is given of the setup for quantized Hall effect measurements. Preliminary results, obtained with MOCVD grown GaAs-AIGaAs heterojunctions, are presented. These include temperature dependence of the quantized Hall resistance. Overall accuracy is estimated to be better than 0.2 ppm.
  • Keywords
    Circuits; Density estimation robust algorithm; Electrical resistance measurement; Hall effect; Heterojunctions; Laboratories; MOCVD; Magnetic field measurement; Noise level; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1985.4315333
  • Filename
    4315333
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1206202