Title :
On the Implementation of an Analog ATPG: The Linear Case
Author :
Wey, Chin-Long ; Saeks, Richard
Abstract :
A self-testing algorithm in which post-test simulation with failure bounds is employed, has been proposed. Based on this self-testing algorithm, an analog Automatic Test Program Generation (ATPG) for linear circuits or systems is being developed. The AATPG code is subdivided into off-line and on-line components while the actual test can be run in either a fully automatic mode or interactively.
Keywords :
Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Equations; System testing; Vectors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1985.4315366
