• DocumentCode
    1206822
  • Title

    In Situ Emission Microscopy of Scandium/Scandium-Oxide and Barium/Barium-Oxide Thin Films on Tungsten

  • Author

    Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.

  • Author_Institution
    Ohio Univ., Athens, OH
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    794
  • Lastpage
    798
  • Abstract
    The effect of a thin Sc/Sc-oxide base layer on Ba/Ba-oxide electron emission, surface diffusion, adsorption, and desorption on W is studied using photoelectron emission microscopy and thermionic emission microscopy. A barium-on-scandium structure enhances both photo- and thermionic electron emission.
  • Keywords
    adsorption; barium; barium compounds; desorption; electron emission; optical microscopy; photoelectron microscopy; scandium; scandium compounds; surface diffusion; thermionic electron emission; thin films; Ba-BaO; Sc-ScO; W; adsorption; barium-on-scandium structure; desorption; oxide base layer; oxide electron emission; photoelectron emission; photoelectron emission microscopy; surface diffusion; thermionic emission microscopy; Barium; Cathodes; Electron emission; Heating; Kinetic energy; Photoelectron microscopy; Scanning electron microscopy; Temperature; Thermionic emission; Tungsten; Photoelectron emission microscopy (PEEM); scandate cathode; thermionic cathode; thermionic emission microscopy (ThEEM);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2015410
  • Filename
    4806053