DocumentCode :
1207042
Title :
A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration
Author :
Jamal, Shafiq M. ; Fu, Daihong ; Chang, Nick C -J ; Hurst, Paul J. ; Lewis, Stephen H.
Author_Institution :
California Univ., Davis, CA, USA
Volume :
37
Issue :
12
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
1618
Lastpage :
1627
Abstract :
Digital calibration using adaptive signal processing corrects for offset mismatch, gain mismatch, and sample-time error between time-interleaved channels in a 10-b 120-Msample/s pipelined analog-to-digital converter (ADC). Offset mismatch between channels is overcome with a random chopper-based offset calibration. Gain mismatch and sample-time error are overcome with correlation-based algorithms, which drive the correlation between a signal and its chopped image or its chopped and delayed image to zero. Test results show that, with a 0.99-MHz sinusoidal input, the ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 56.8 dB, a peak integral nonlinearity of 0.88 least significant bit (LSB), and a peak differential nonlinearity of 0.44 LSB. For a 39.9-MHz sinusoidal input, the ADC achieves a peak SNDR of 50.2 dB. The active area is 5.2 mm2, and the power dissipation is 234 mW from a 3.3-V supply.
Keywords :
CMOS integrated circuits; adaptive signal processing; analogue-digital conversion; calibration; correlation methods; low-power electronics; pipeline processing; 0.99 MHz; 10 bit; 234 mW; 3.3 V; 39.9 MHz; SNDR; adaptive signal processing; correlation-based algorithms; delayed image; digital background calibration; gain mismatch; least significant bit; offset mismatch; peak differential nonlinearity; peak integral nonlinearity; peak signal-to-noise-and-distortion ratio; pipelined analog-to-digital converter; power dissipation; random chopper-based offset calibration; sample-time error; time-interleaved analog-to-digital converter; time-interleaved channels; Adaptive signal processing; Analog-digital conversion; Apertures; Calibration; Delay; Error correction; Signal processing; Signal processing algorithms; Signal sampling; Testing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.804327
Filename :
1088088
Link To Document :
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