• DocumentCode
    1207070
  • Title

    Active Control of Microinterferometers for Low-Noise Parallel Operation

  • Author

    Karhade, Omkar G. ; Degertekin, F. Levent ; Kurfess, Thomas R.

  • Author_Institution
    Assembly & Test Technol. Dev., Intel Corp., Chandler, AZ, USA
  • Volume
    15
  • Issue
    1
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Active control of phase-sensitive interferometric metrology systems is necessary for low noise, high resolution, high bandwidth, and parallel operation. Conventional active control methods have several drawbacks like low SNR, high complexity, and low bandwidth. With the development of micromachined scanning grating interferometers ( muSGIs), high-bandwidth parallel active control of an array of interferometers is feasible. This paper introduces a novel ldquorecurrent-calibration-based active control algorithm.rdquo Utilizing the high-bandwidth integrated electrostatic actuator, this algorithm splits the calibration of the optics and the displacement measurement in time to achieve better noise reduction. The novel algorithm is implemented digitally using a field-programmable gate array on an array of muSGIs simultaneously. Nonlinearity and the limited range of actuation of the electrostatic actuator affect the performance of the active control. It is compensated by using a lookup table and a gain reversal algorithm. A system model is built to design and analyze the control algorithm. A muSGI interferometer setup validates the model and control approach. The control algorithm reduces the vibration noise by 40 dB at low frequencies with a cutoff frequency of 6.5 kHz. The resolution of the muSGI coupled with the control system is measured as 1 times 10-4 nmrms/radic(Hz) .
  • Keywords
    electrostatic actuators; field programmable gate arrays; interferometers; measurement; active control; displacement measurement; field-programmable gate array; high-bandwidth integrated electrostatic actuator; low-noise parallel operation; microinterferometers; micromachined scanning grating interferometers; noise reduction; optics; phase-sensitive interferometric metrology systems; Active control; array operation; interferometer; metrology;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2009.2011897
  • Filename
    4806080