DocumentCode
1207070
Title
Active Control of Microinterferometers for Low-Noise Parallel Operation
Author
Karhade, Omkar G. ; Degertekin, F. Levent ; Kurfess, Thomas R.
Author_Institution
Assembly & Test Technol. Dev., Intel Corp., Chandler, AZ, USA
Volume
15
Issue
1
fYear
2010
Firstpage
1
Lastpage
8
Abstract
Active control of phase-sensitive interferometric metrology systems is necessary for low noise, high resolution, high bandwidth, and parallel operation. Conventional active control methods have several drawbacks like low SNR, high complexity, and low bandwidth. With the development of micromachined scanning grating interferometers ( muSGIs), high-bandwidth parallel active control of an array of interferometers is feasible. This paper introduces a novel ldquorecurrent-calibration-based active control algorithm.rdquo Utilizing the high-bandwidth integrated electrostatic actuator, this algorithm splits the calibration of the optics and the displacement measurement in time to achieve better noise reduction. The novel algorithm is implemented digitally using a field-programmable gate array on an array of muSGIs simultaneously. Nonlinearity and the limited range of actuation of the electrostatic actuator affect the performance of the active control. It is compensated by using a lookup table and a gain reversal algorithm. A system model is built to design and analyze the control algorithm. A muSGI interferometer setup validates the model and control approach. The control algorithm reduces the vibration noise by 40 dB at low frequencies with a cutoff frequency of 6.5 kHz. The resolution of the muSGI coupled with the control system is measured as 1 times 10-4 nmrms/radic(Hz) .
Keywords
electrostatic actuators; field programmable gate arrays; interferometers; measurement; active control; displacement measurement; field-programmable gate array; high-bandwidth integrated electrostatic actuator; low-noise parallel operation; microinterferometers; micromachined scanning grating interferometers; noise reduction; optics; phase-sensitive interferometric metrology systems; Active control; array operation; interferometer; metrology;
fLanguage
English
Journal_Title
Mechatronics, IEEE/ASME Transactions on
Publisher
ieee
ISSN
1083-4435
Type
jour
DOI
10.1109/TMECH.2009.2011897
Filename
4806080
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