• DocumentCode
    1207086
  • Title

    A 64-MHz clock-rate ΣΔ ADC with 88-dB SNDR and -105-dB IM3 distortion at a 1.5-MHz signal frequency

  • Author

    Gupta, Sandeep K. ; Fong, Victor

  • Author_Institution
    Broadcom Corp., Irvine, CA, USA
  • Volume
    37
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1653
  • Lastpage
    1661
  • Abstract
    A 64-MHz clock rate sigma-delta (ΣΔ) analog-to-digital converter (ADC) with -105-dB intermodulation distortion (IMD) at a 1.5-MHz signal frequency is reported. A linear replica bridge sampling network enables the ADC to achieve high linearity for high signal frequencies. Operating at an oversampling ratio of 29, a 2-1-1 cascade with a 2-b quantizer in the last stage reduces the quantization noise level well below that of the thermal noise. The measured signal-to-noise and distortion ratio (SNDR) in 1.1-MHz bandwidth is 88 dB, and the spurious-free-dynamic-range (SFDR) is 106 dB. The modulator and reference buffers occupy a 2.6-mm2 die area and have been implemented with thick oxide devices, with minimum channel length of 0.35 μm, in a dual-gate 0.18-μm 1.8-V single-poly five-metal (SP5M) digital CMOS process. The power consumed by the ADC is 230 mW, including the decimation filters.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; cascade networks; integrated circuit noise; intermodulation distortion; quantisation (signal); sigma-delta modulation; switched capacitor networks; thermal noise; ΣΔ ADC; 0.18 micron; 0.35 micron; 1.1 MHz; 1.5 MHz; 230 mW; 64 MHz; IM3 distortion; SNDR; channel length; clock rate; decimation filters; linear replica bridge sampling network; linearity; oversampling ratio; quantization noise level; signal frequency; signal-to-noise and distortion ratio; single-poly five-metal digital CMOS process; spurious-free-dynamic-range; thermal noise; Analog-digital conversion; Bridges; Clocks; Delta-sigma modulation; Distortion measurement; Frequency conversion; Intermodulation distortion; Linearity; Noise level; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.804358
  • Filename
    1088092