DocumentCode :
1207086
Title :
A 64-MHz clock-rate ΣΔ ADC with 88-dB SNDR and -105-dB IM3 distortion at a 1.5-MHz signal frequency
Author :
Gupta, Sandeep K. ; Fong, Victor
Author_Institution :
Broadcom Corp., Irvine, CA, USA
Volume :
37
Issue :
12
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
1653
Lastpage :
1661
Abstract :
A 64-MHz clock rate sigma-delta (ΣΔ) analog-to-digital converter (ADC) with -105-dB intermodulation distortion (IMD) at a 1.5-MHz signal frequency is reported. A linear replica bridge sampling network enables the ADC to achieve high linearity for high signal frequencies. Operating at an oversampling ratio of 29, a 2-1-1 cascade with a 2-b quantizer in the last stage reduces the quantization noise level well below that of the thermal noise. The measured signal-to-noise and distortion ratio (SNDR) in 1.1-MHz bandwidth is 88 dB, and the spurious-free-dynamic-range (SFDR) is 106 dB. The modulator and reference buffers occupy a 2.6-mm2 die area and have been implemented with thick oxide devices, with minimum channel length of 0.35 μm, in a dual-gate 0.18-μm 1.8-V single-poly five-metal (SP5M) digital CMOS process. The power consumed by the ADC is 230 mW, including the decimation filters.
Keywords :
CMOS integrated circuits; analogue-digital conversion; cascade networks; integrated circuit noise; intermodulation distortion; quantisation (signal); sigma-delta modulation; switched capacitor networks; thermal noise; ΣΔ ADC; 0.18 micron; 0.35 micron; 1.1 MHz; 1.5 MHz; 230 mW; 64 MHz; IM3 distortion; SNDR; channel length; clock rate; decimation filters; linear replica bridge sampling network; linearity; oversampling ratio; quantization noise level; signal frequency; signal-to-noise and distortion ratio; single-poly five-metal digital CMOS process; spurious-free-dynamic-range; thermal noise; Analog-digital conversion; Bridges; Clocks; Delta-sigma modulation; Distortion measurement; Frequency conversion; Intermodulation distortion; Linearity; Noise level; Sampling methods;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.804358
Filename :
1088092
Link To Document :
بازگشت