DocumentCode :
1207249
Title :
A multiple-crystal interface PLL with VCO realignment to reduce phase noise
Author :
Ye, Sheng ; Jansson, Lars ; Galton, Ian
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Volume :
37
Issue :
12
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
1795
Lastpage :
1803
Abstract :
An enhancement to a conventional integer-N phase-locked loop (PLL) is introduced, analyzed, and demonstrated experimentally to significantly reduce voltage-controlled oscillator (VCO) phase noise. The enhancement, which involves periodically injection locking the VCO to a buffered version of the reference, has the effect of widening the PLL bandwidth and reducing the overall phase noise. It is demonstrated in a 3-V 6.8-mW CMOS reference PLL with a ring VCO capable of converting most of the popular crystal reference frequencies to a 96-MHz RF PLL reference and baseband clock for a direct conversion Bluetooth wireless LAN. The peak in-band phase noise at an offset of 20 kHz is -102 dBc/Hz with the technique enabled and -92 dBc/Hz with the technique disabled. A theoretical analysis is presented and shown to be in close agreement with the measured results.
Keywords :
Bluetooth; CMOS analogue integrated circuits; VHF oscillators; delay lock loops; injection locked oscillators; integrated circuit noise; phase locked loops; phase noise; voltage-controlled oscillators; wireless LAN; 3 V; 6.8 mW; 96 MHz; 96-MHz RF PLL reference; BiCMOS SOI process; CMOS reference PLL; DLL extension; PLL bandwidth; VCO realignment; baseband clock; buffered version; direct conversion Bluetooth wireless LAN; integer-N phase-locked loop; multiple-crystal interface PLL; peak in-band phase noise; periodic injection locking; phase noise reduction; ring VCO; Bandwidth; Baseband; Bluetooth; Clocks; Frequency conversion; Injection-locked oscillators; Phase locked loops; Phase noise; Radio frequency; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.804339
Filename :
1088109
Link To Document :
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