DocumentCode
1207249
Title
A multiple-crystal interface PLL with VCO realignment to reduce phase noise
Author
Ye, Sheng ; Jansson, Lars ; Galton, Ian
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Volume
37
Issue
12
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
1795
Lastpage
1803
Abstract
An enhancement to a conventional integer-N phase-locked loop (PLL) is introduced, analyzed, and demonstrated experimentally to significantly reduce voltage-controlled oscillator (VCO) phase noise. The enhancement, which involves periodically injection locking the VCO to a buffered version of the reference, has the effect of widening the PLL bandwidth and reducing the overall phase noise. It is demonstrated in a 3-V 6.8-mW CMOS reference PLL with a ring VCO capable of converting most of the popular crystal reference frequencies to a 96-MHz RF PLL reference and baseband clock for a direct conversion Bluetooth wireless LAN. The peak in-band phase noise at an offset of 20 kHz is -102 dBc/Hz with the technique enabled and -92 dBc/Hz with the technique disabled. A theoretical analysis is presented and shown to be in close agreement with the measured results.
Keywords
Bluetooth; CMOS analogue integrated circuits; VHF oscillators; delay lock loops; injection locked oscillators; integrated circuit noise; phase locked loops; phase noise; voltage-controlled oscillators; wireless LAN; 3 V; 6.8 mW; 96 MHz; 96-MHz RF PLL reference; BiCMOS SOI process; CMOS reference PLL; DLL extension; PLL bandwidth; VCO realignment; baseband clock; buffered version; direct conversion Bluetooth wireless LAN; integer-N phase-locked loop; multiple-crystal interface PLL; peak in-band phase noise; periodic injection locking; phase noise reduction; ring VCO; Bandwidth; Baseband; Bluetooth; Clocks; Frequency conversion; Injection-locked oscillators; Phase locked loops; Phase noise; Radio frequency; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2002.804339
Filename
1088109
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