• DocumentCode
    1207315
  • Title

    Novel CMOS image sensor with a 132-dB dynamic range

  • Author

    Stoppa, David ; Simoni, Andrea ; Gonzo, Lorenzo ; Gottardi, Massimo ; Dalla Betta, Gian-Franco

  • Author_Institution
    Centro per la Ricerca Scientifica e Tecnologica, Povo, Italy
  • Volume
    37
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1846
  • Lastpage
    1852
  • Abstract
    A CMOS image sensor providing an ultrawide dynamic range with a piecewise linear response is presented. The active pixel is based on a novel architecture which implements a voltage comparator and an analog memory to detect and store the information on the integration time needed to reach saturation, while also maintaining the standard integrated photo-current signal. A 128×64 pixel array has been designed and fabricated in 0.35-μm, 3.3-V CMOS technology. The chip measures 2.67×4.90 mm2 with a pixel size of 24.65×24.65 μm2 and a fill factor of about 11%. The sensor has been fully characterized and the measured dynamic range turned out to be 132 dB with a power consumption of 14 mW at video frame rate. The sensor features also good noise performance with a temporal noise of 0.2% (1.7%) and a fixed pattern noise of 0.4% (1.5%) at low (high) irradiance.
  • Keywords
    CMOS image sensors; analogue storage; comparators (circuits); integrated circuit noise; piecewise linear techniques; 0.35 micron; 128 pixel; 128×64 pixel array; 14 mW; 3.3 V; 64 pixel; 8292 pixel; CMOS image sensor; active pixel; analog memory; fill factor; fixed pattern noise; high irradiance; integrated photo-current signal; integration time; low irradiance; noise performance; piecewise linear response; pixel size; power consumption; temporal noise; ultrawide dynamic range; video camera; video frame rate; voltage comparator; Analog memory; CMOS image sensors; CMOS technology; Dynamic range; Piecewise linear techniques; Power measurement; Semiconductor device measurement; Sensor phenomena and characterization; Size measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.804347
  • Filename
    1088115