Title :
Study of applying load shedding scheme with dynamic D-factor values of various dynamic load models to Taiwan power system
Author :
Lu, Ying ; Kao, Wen-Shiow ; Chen, Yung-Tien
Author_Institution :
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taiwan
Abstract :
This paper describes the application of proposed under-frequency load shedding scheme with dynamic D-factors, i.e., load frequency and voltage dependent coefficients, of various dynamic load models to Taiwan power system. The load models adopted are: 1) a single-motor dynamic model, 2) a two-motor (one small and one large) dynamic model, and 3) a composite (static and dynamic) model. First, the dynamic D-factor values of these load models are determined by the actual analytical approach employed in Taiwan power system. Then, a single-machine model representing a multi-machine power system is utilized for validating the proposed load shedding scheme with derived dynamic D-factor values. Finally, time simulation results of load shedding applied to various load models are compared with field measurement data, which are obtained from Taiwan power system in the case of three-phase short circuit fault, to evaluate the effects of different load models on the proposed load shedding scheme, based on the restoration of system frequency.
Keywords :
electric motors; load shedding; power system faults; power system restoration; power system simulation; short-circuit currents; D-factor value; Taiwan power system; analytical approach; dynamic load model; field measurement data; motor dynamic model; multimachine power system; power system restoration; spinning reserve; three-phase short circuit fault; time simulation; under-frequency load shedding; Frequency; Load modeling; Power system analysis computing; Power system dynamics; Power system faults; Power system measurements; Power system modeling; Power system restoration; Power system simulation; Voltage; Dynamic; load model; spinning reserve; under-frequency load shedding;
Journal_Title :
Power Systems, IEEE Transactions on
DOI :
10.1109/TPWRS.2005.856988