Title :
Reliability analysis of the double counter-rotating ring with concentrator attachments
Author :
Logothetis, Dimitris ; Trivedi, Kishor S.
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
fDate :
10/1/1994 12:00:00 AM
Abstract :
The inherently weak reliability behavior of the ring architecture has led network designers to consider various design choices to improve network reliability. We assess the impact of provisions such as node bypass, secondary ring and concentrator trees on network reliability. For this reason, we develop closed-form expressions for the reliability and the mean time-to-failure of the double counter-rotating ring architecture. For our comparisons we adopt the 2-terminal, and the all-terminal reliability criteria. Our network reliability expressions are valid for any time-to-failure distributions of links and nodes
Keywords :
computer network reliability; failure analysis; line concentrators; 2-terminal reliability; all-terminal reliability; closed-form expressions; concentrator attachments; concentrator trees; distributed double loop computer network; double counter-rotating ring; link failure; mean time-to-failure; network reliability; node bypass; node failure; reliability analysis; ring architecture; secondary ring; time-to-failure distributions; Asynchronous transfer mode; Broadcasting; Closed-form solution; Computer architecture; Computer network reliability; FDDI; SONET; Steady-state; Telecommunication network reliability; Token networks;
Journal_Title :
Networking, IEEE/ACM Transactions on
