DocumentCode :
1207654
Title :
Design of Spin-Torque Transfer Magnetoresistive RAM and CAM/TCAM with High Sensing and Search Speed
Author :
Xu, Wei ; Zhang, Tong ; Chen, Yiran
Author_Institution :
Dept. of Electr., Comput., & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
18
Issue :
1
fYear :
2010
Firstpage :
66
Lastpage :
74
Abstract :
With a great scalability potential, nonvolatile magnetoresistive memory with spin-torque transfer (STT) programming has become a topic of great current interest. This paper addresses cell structure design for STT magnetoresistive RAM, content addressable memory (CAM) and ternary CAM (TCAM). We propose a new RAM cell structure design that can realize high speed and reliable sensing operations in the presence of relatively poor magnetoresistive ratio, while maintaining low sensing current through magnetic tunneling junctions (MTJs). We further apply the same basic design principle to develop new cell structures for nonvolatile CAM, and TCAM. The effectiveness of the proposed RAM, CAM and TCAM cell structures has been demonstrated by circuit simulation at 0.18 ??m CMOS technology.
Keywords :
CMOS memory circuits; MRAM devices; circuit simulation; content-addressable storage; magnetic tunnelling; spin systems; CMOS technology; TCAM cell structure; cell structure design; circuit simulation; content addressable memory; magnetic tunneling junction; nonvolatile magnetoresistive memory; reliable sensing operation; search speed; size 0.18 mum; spin-torque transfer magnetoresistive RAM; ternary CAM; Content addressable memory (CAM); magnetic tunneling junction (MTJ); magnetoresistive random access memory (MRAM); spin-torque transfer (STT) magnetoresistive memory; ternary CAM (TCAM);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2007735
Filename :
4806136
Link To Document :
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