Title :
Comparison and extension of recent one-dimensional bipolar transistor models
Author :
Chen, Meng-Kai ; Lindholm, Fredrik A. ; Wu, Ben S.
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
fDate :
7/1/1988 12:00:00 AM
Abstract :
Various nonquasistatic (NQS) improvements of the Gummel-Pooh integral charge-control model are considered for both small-signal and large-signal excitations. The comparison includes the partitioned-charge-based (PCB) model by J.G. Fossum and S.V. Veeraraghaven (1986), the transient integral charge-control model (TICC) by H. Klose and A.W. Wieder (1987), and negative-capacitance (NC) and inductive (L) NQS equivalent circuits derived by truncation in the complex-frequency domain. For forward-active operation and an exponential doping profile in the base layer, the NC model is equivalent to the TICC model. For a uniform doping profile, the NC, TICC, and PCB models are equivalent. These three models, however, predict that the magnitude of the transconductances rises with frequency for high frequencies, a trend that, in principle, is incorrect. Truncation in the s-domain gives insight concerning this trend and provides a better model, i.e., the L model. The method of truncation used is well suited to bipolar transistors; is not suited to MOS and other devices in which space-charge-limited flow prevails
Keywords :
bipolar transistors; equivalent circuits; semiconductor device models; 1D models; Gummel-Pooh integral charge-control model; base layer; bipolar transistor models; complex-frequency domain; exponential doping profile; forward-active operation; inductive equivalent circuits; large-signal excitations; negative capacitance equivalent circuits; nonquasistatic type; one dimensional models; partitioned charge based model; s-domain; transconductances; transient integral charge-control model; truncation; uniform doping profile; Bipolar transistors; Delay; Doping profiles; Electron emission; Equivalent circuits; Frequency; Predictive models; Semiconductor process modeling; Transconductance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on