• DocumentCode
    1207835
  • Title

    Comparison and extension of recent one-dimensional bipolar transistor models

  • Author

    Chen, Meng-Kai ; Lindholm, Fredrik A. ; Wu, Ben S.

  • Author_Institution
    Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
  • Volume
    35
  • Issue
    7
  • fYear
    1988
  • fDate
    7/1/1988 12:00:00 AM
  • Firstpage
    1096
  • Lastpage
    1106
  • Abstract
    Various nonquasistatic (NQS) improvements of the Gummel-Pooh integral charge-control model are considered for both small-signal and large-signal excitations. The comparison includes the partitioned-charge-based (PCB) model by J.G. Fossum and S.V. Veeraraghaven (1986), the transient integral charge-control model (TICC) by H. Klose and A.W. Wieder (1987), and negative-capacitance (NC) and inductive (L) NQS equivalent circuits derived by truncation in the complex-frequency domain. For forward-active operation and an exponential doping profile in the base layer, the NC model is equivalent to the TICC model. For a uniform doping profile, the NC, TICC, and PCB models are equivalent. These three models, however, predict that the magnitude of the transconductances rises with frequency for high frequencies, a trend that, in principle, is incorrect. Truncation in the s-domain gives insight concerning this trend and provides a better model, i.e., the L model. The method of truncation used is well suited to bipolar transistors; is not suited to MOS and other devices in which space-charge-limited flow prevails
  • Keywords
    bipolar transistors; equivalent circuits; semiconductor device models; 1D models; Gummel-Pooh integral charge-control model; base layer; bipolar transistor models; complex-frequency domain; exponential doping profile; forward-active operation; inductive equivalent circuits; large-signal excitations; negative capacitance equivalent circuits; nonquasistatic type; one dimensional models; partitioned charge based model; s-domain; transconductances; transient integral charge-control model; truncation; uniform doping profile; Bipolar transistors; Delay; Doping profiles; Electron emission; Equivalent circuits; Frequency; Predictive models; Semiconductor process modeling; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.3369
  • Filename
    3369