• DocumentCode
    1208465
  • Title

    Nuclear spin-lattice relaxation in superlattices

  • Author

    Shik, Alexander ; Ruda, Harry E. ; Vagner, Israel D.

  • Author_Institution
    Centre for Adv. Nanotechnol., Univ. of Toronto, Ont., Canada
  • Volume
    4
  • Issue
    1
  • fYear
    2005
  • Firstpage
    83
  • Lastpage
    89
  • Abstract
    The nuclear spin-lattice relaxation rate in a superlattice subjected to a strong magnetic field H parallel to its axis is studied theoretically. The energy conservation law allows flip-flop spin-reversal processes due to the hyperfine interaction between the nuclear and electron spins only in some intervals of H. In particular, the width of the highest occupied superlattice subband Δ must exceed the spin splitting of Landau levels, which results in the relaxation offset at some critical magnetic field H2. At H2 and low temperatures, the relaxation rate T1-1 versus H dependence has giant oscillations depending on the Fermi level position. The behavior of T1 can be changed by the tilting of the magnetic field, decreasing the Landau level separation at a constant spin-splitting. At some critical tilt angle, these two quantities become equal and inter-Landau-level processes come into action which drastically increases the relaxation rate.
  • Keywords
    Fermi level; Landau levels; electron relaxation time; g-factor; hyperfine interactions; nuclear spin-lattice relaxation; superlattices; Fermi level position; Landau levels; critical magnetic field; critical tilt angle; energy conservation law; flip-flop spin reversal processes; giant oscillations; hyperfine interaction; nuclear spin-lattice relaxation rate; nuclear-electron spins; relaxation offset; spin splitting; superlattices; Electrons; Magnetic fields; Magnetic properties; Magnetic semiconductors; Magnetic separation; Magnetic superlattices; Magnetoelectronics; Nuclear electronics; Quantization; Superconducting magnets;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.840159
  • Filename
    1381399