• DocumentCode
    1208509
  • Title

    Nanofabrication aspects of silicon-based spin quantum gates

  • Author

    Koiller, Belita ; Hu, Xuedong

  • Author_Institution
    Inst. de Fisica, Univ. Fed. do Rio de Janeiro, Brazil
  • Volume
    4
  • Issue
    1
  • fYear
    2005
  • Firstpage
    113
  • Lastpage
    115
  • Abstract
    Electronic and nuclear spins of shallow donors in silicon are particularly attractive among the solid-state systems considered for quantum information storage and processing. Shallow donor exchange gates are frequently invoked to preform two-qubit operations for these spin qubits. Careful analysis of the feasibility of such operations demands realistic descriptions of the underlying electronic structure in Si. Intervalley interference between the conduction-band-edge states of Si leads to oscillatory behavior in the donor-pair exchange J. We calculate the exchange coupling for two donors within the Heitler-London approach and show that, if the donors can be placed at substitutional sites precisely along the [100] crystal direction, the oscillatory behavior of J may be essentially ignored in practice. However, small uncertainties in the relative positioning-between 1-5 nm-with respect to this ideal direction lead to a broad distribution of J values peaked at J∼0, posing severe limitations in the nanofabrication of shallow donor arrays and exchange gates in Si.
  • Keywords
    conduction bands; elemental semiconductors; impurity distribution; impurity states; nanotechnology; phosphorus; quantum gates; silicon; 1 to 5 nm; Si:P; conduction band edge states; electronic spins; electronic structure; nanofabrication; nuclear spins; oscillatory properties; quantum information storage; shallow donor exchange gates; silicon based spin quantum gates; spin qubit operations; Capacitive sensors; Electrons; Fabrication; Interference; Nanofabrication; Proposals; Quantum computing; Semiconductor impurities; Silicon; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.840166
  • Filename
    1381404