Title :
Energy awareness and uncertainty in microarchitecture-level design
Author :
Marculescu, Diana ; Talpes, Emil
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
The authors present microarchitecture-level statistical models for characterizing process and system parameter variability, concentrating on gate length and on-chip temperature variations. To assess the effect of microarchitecture decisions on these variations, and vice versa, they propose a joint performance, power, and variability metric that distinguishes among various design choices.
Keywords :
logic design; microprocessor chips; system-on-chip; energy awareness; energy uncertainty; gate length; microarchitecture decisions; microarchitecture-level design; microarchitecture-level statistical models; on-chip temperature variations; process parameter variability; system parameter variability; Clocks; Lithography; Logic design; Microarchitecture; Performance analysis; Power system modeling; Temperature; Thermal stresses; Uncertainty; Voltage; Energy awareness; gate length; on-chip temperature variations; variability metric;
Journal_Title :
Micro, IEEE
