DocumentCode
1208644
Title
Deterministic addressing of nanoscale devices assembled at sublithographic pitches
Author
DeHon, André
Author_Institution
Comput. Sci. Dept., California Inst. of Technol., Pasadena, CA, USA
Volume
4
Issue
6
fYear
2005
Firstpage
681
Lastpage
687
Abstract
Multiple techniques have now been proposed using random addressing to build demultiplexers which interface between the large pitch of lithographically patterned features and the smaller pitch of self-assembled sublithographic nanowires. At the same time, the relatively high defect rates expected for molecular-sized devices and wires dictate that we design architectures with spare components so we can map around defective elements. To accommodate and mask both of these effects, we introduce a programmable addressing scheme which can be used to provide deterministic addresses for decoders built with random nanoscale addressing and potentially defective wires. We describe how this programmable addressing scheme can be implemented with emerging, nanoscale building blocks and show how to build deterministically addressable memory banks. We characterize the area required for this programmable addressing scheme. For 2048×2048 memory banks, the area overhead for address correction is less than 33%, delivering net memory densities around 1011 b/cm2.
Keywords
demultiplexing equipment; molecular electronics; nanoelectronics; nanolithography; nanowires; programmable logic devices; addressable memory banks; decoders; defect tolerance; defective wires; delivering net memory densities; demultiplexers; design architectures; electronic nanotechnology; lithographically patterned features; molecular electronics; molecular-sized devices; multiple techniques; nanoscale building blocks; nanoscale devices; programmable addressing scheme; random nanoscale addressing; self-assembled sublithographic nanowires; stochastic assembly; sublithographic pitches; Assembly; Decoding; Logic programming; Nanoscale devices; Nanotechnology; Nanowires; Programmable logic arrays; Self-assembly; Space technology; Wires; Defect tolerance; electronic nanotechnology; molecular electronics; stochastic assembly;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2005.858587
Filename
1528471
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