DocumentCode :
1208680
Title :
Dry-etched 650 nm AlGaInP visible-light laser diodes with operating time of over 3000 h
Author :
Yoshikawa, Tomoki ; Sugimoto, Yoshiki ; Hotta, Hitoshi ; Tada, Kazuki ; Kobayashi, Kaoru ; Miyasaka, F. ; Asakawa, K.
Author_Institution :
Opto-Electron. Res. Labs., NEC Corp., Ibaraki
Volume :
30
Issue :
24
fYear :
1994
fDate :
11/24/1994 12:00:00 AM
Firstpage :
2035
Lastpage :
2037
Abstract :
The authors have achieved CW operation of 650 nm GaInP/AlGaInP index waveguide-type visible-light laser diodes (LDs) with dry-etched mesa stripes fabricated by Cl2 reactive ion beam etching. The threshold current of 47 mA and slope efficiency of 0.40 W/A are almost the same as those of a wet-etched LD fabricated from the same wafer (L=500 μm). The cross-sectional scanning electron microscope view of the buried mesa stripe shows that the dry-etched LD has a symmetric mesa shape resulting in a small focusing spot and stable mode operation. The wet-etched mesa, however, is asymmetric because a 6° misoriented substrate is used for this wavelength operation. An aging test with light output power of 3 mW at 50°C has revealed that these LDs have an operating time of over 3000 h, which represents a sufficient reliability for conventional uses
Keywords :
III-V semiconductors; aluminium compounds; etching; gallium compounds; indium compounds; ion beam applications; laser modes; life testing; refractive index; semiconductor device testing; semiconductor lasers; waveguide lasers; 3 mW; 3000 h; 47 mA; 500 mum; 650 nm; AlGaInP; AlGaInP visible-light laser diodes; CW operation; Cl2; Cl2 reactive ion beam etching; GaInP/AlGaInP index waveguide-type visible-light laser diodes; aging test; buried mesa stripe; cross-sectional scanning electron microscope; dry-etched; dry-etched LD; dry-etched mesa stripes; light output power; misoriented substrate; operating time; reliability; slope efficiency; small focusing spot; stable mode operation; symmetric mesa shape; threshold current; wavelength operation; wet-etched;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19941367
Filename :
337977
Link To Document :
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