Title : 
Dry-etched 650 nm AlGaInP visible-light laser diodes with operating time of over 3000 h
         
        
            Author : 
Yoshikawa, Tomoki ; Sugimoto, Yoshiki ; Hotta, Hitoshi ; Tada, Kazuki ; Kobayashi, Kaoru ; Miyasaka, F. ; Asakawa, K.
         
        
            Author_Institution : 
Opto-Electron. Res. Labs., NEC Corp., Ibaraki
         
        
        
        
        
            fDate : 
11/24/1994 12:00:00 AM
         
        
        
        
            Abstract : 
The authors have achieved CW operation of 650 nm GaInP/AlGaInP index waveguide-type visible-light laser diodes (LDs) with dry-etched mesa stripes fabricated by Cl2 reactive ion beam etching. The threshold current of 47 mA and slope efficiency of 0.40 W/A are almost the same as those of a wet-etched LD fabricated from the same wafer (L=500 μm). The cross-sectional scanning electron microscope view of the buried mesa stripe shows that the dry-etched LD has a symmetric mesa shape resulting in a small focusing spot and stable mode operation. The wet-etched mesa, however, is asymmetric because a 6° misoriented substrate is used for this wavelength operation. An aging test with light output power of 3 mW at 50°C has revealed that these LDs have an operating time of over 3000 h, which represents a sufficient reliability for conventional uses
         
        
            Keywords : 
III-V semiconductors; aluminium compounds; etching; gallium compounds; indium compounds; ion beam applications; laser modes; life testing; refractive index; semiconductor device testing; semiconductor lasers; waveguide lasers; 3 mW; 3000 h; 47 mA; 500 mum; 650 nm; AlGaInP; AlGaInP visible-light laser diodes; CW operation; Cl2; Cl2 reactive ion beam etching; GaInP/AlGaInP index waveguide-type visible-light laser diodes; aging test; buried mesa stripe; cross-sectional scanning electron microscope; dry-etched; dry-etched LD; dry-etched mesa stripes; light output power; misoriented substrate; operating time; reliability; slope efficiency; small focusing spot; stable mode operation; symmetric mesa shape; threshold current; wavelength operation; wet-etched;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19941367