DocumentCode :
1208688
Title :
Assessment of high-frequency performance potential of carbon nanotube transistors
Author :
Guo, Jing ; Hasan, Sayed ; Javey, Ali ; Bosman, Gijs ; Lundstrom, Mark
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
Volume :
4
Issue :
6
fYear :
2005
Firstpage :
715
Lastpage :
721
Abstract :
Self-consistent quantum simulations are used to explore the high-frequency performance potential of carbon nantube field-effect transistors (CNTFETs). The cutoff frequency expected for a recently reported CNT Schottky-barrier FET is well below the performance limit, due to the large parasitic capacitance between electrodes. We show that using an array of parallel nanotubes as the transistor channel reduces parasitic capacitance per tube. Increasing tube density gives a large improvement of high-frequency performance when tubes are widely spaced and parasitic capacitance dominates but only a small improvement when the tube spacing is small and intrinsic gate capacitance dominates. Alternatively, using quasi-one-dimensional nanowires as source and drain contacts should significantly reduce parasitic capacitance and improve high-frequency performance. Ballistic CNTFETs should outperform ballistic Si MOSFETs in terms of the high-frequency performance limit because of their larger band-structure-limited velocity.
Keywords :
SCF calculations; Schottky barriers; capacitance; carbon nanotubes; field effect transistors; high-frequency effects; quantum theory; C; CNT Schottky-barrier FET; ballistic CNTFETs; band-structure-limited velocity; carbon nanotube field-effect transistor potentials; cutoff frequency; drain contacts; electrodes; high-frequency effects; intrinsic gate capacitance; parasitic capacitance; quasi 1D nanowires; self-consistent quantum simulations; transistor channels; tube density; CNTFETs; Carbon nanotubes; Current measurement; Cutoff frequency; Electrodes; FETs; MOSFETs; Nanowires; Parasitic capacitance; Radio frequency; Carbon nanotubes (CNTs); field-effect transistors (FETs); radio frequency (RF);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2005.858601
Filename :
1528476
Link To Document :
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