Title : 
A Reconfigurable 1 GSps to 250 MSps, 7-bit to 9-bit Highly Time-Interleaved Counter ADC with Low Power Comparator Design
         
        
            Author : 
Danesh, S. ; Hurwitz, Jeremy ; Findlater, Keith ; Renshaw, D. ; Henderson, Robert
         
        
            Author_Institution : 
Metroic, Edinburgh, UK
         
        
        
        
        
        
        
        
            Abstract : 
A reconfigurable, highly time-interleaved ADC architecture that substantially decouples comparator requirements from input signal bandwidth and system sampling rate constraints is presented. A highly parallel array of low bandwidth, single slope converters achieves low noise and high linearity with very low input capacitance and signal-independent current consumption. A 128-channel counter ADC, implemented in 0.13 μm CMOS, can be configured in real-time as a 1 GSps 7-bit, 500 MSps 8-bit, or 250 MSps 9-bit converter. Central to this approach is a novel parallel slope ramp-generator based on a rotating figure-of-8 resistor ring. The ADC achieves sub 400 fJ/step in all configurations and a near flat SFDR over the entire input signal frequency range. The figure of merit scales favourably to nanometer CMOS technologies.
         
        
            Keywords : 
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); counting circuits; low-power electronics; figure of merit; flat SFDR; input signal bandwidth; low power comparator design; nanometer CMOS technology; parallel slope ramp-generator; reconfigurable highly time-interleaved counter ADC architecture; rotating figure-of-8 resistor ring; signal-independent current consumption; single slope converters; size 0.13 mum; system sampling rate constraints; word length 7 bit to 9 bit; Bandwidth; Clocks; Generators; Linearity; Radiation detectors; Resistors; Timing; Bottom plate ramping; TIC ADC; Time Interleaved Counter ADC; comparator based ADC; global ramp generator; single slope;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2013.2237672