DocumentCode
1208718
Title
On the evaluation of scaling of QCA devices in the presence of defects at manufacturing
Author
Momenzadeh, Mariam ; Huang, Jing ; Tahoori, Mehdi B. ; Lombardi, Fabrizio
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume
4
Issue
6
fYear
2005
Firstpage
740
Lastpage
743
Abstract
In this paper, we evaluate scaling of quantum-dot cellular automata (QCA) devices (majority voter and inverter) in the presence of defects due to process variations in QCA manufacturing. Simulation results using the two engines of QCADesigner are provided and compared to show the defect tolerance of these devices.
Keywords
cellular automata; nanotechnology; quantum computing; quantum dots; QCA designer; QCA manufacturing; defect tolerance; engines; quantum device defects; quantum simulation; quantum-dot cellular automata device scaling; Chemicals; Circuit testing; Engines; Inverters; Logic devices; Manufacturing automation; Manufacturing processes; Pulp manufacturing; Quantum cellular automata; Quantum dots; Defect tolerance; quantum-dot cellular automata (QCA); scaling;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2005.858611
Filename
1528479
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