• DocumentCode
    1208756
  • Title

    A method of moments analysis of electromagnetic coupling through slots using a Gaussian beam expansion

  • Author

    Leviatan, Yehuda ; Hudis, Efim ; Einziger, Pinchas D.

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    37
  • Issue
    12
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    1537
  • Lastpage
    1544
  • Abstract
    A moment solution is presented for the problem of transverse electric (to the slot axis) electromagnetic coupling through a slot in infinitesimally thin, perfectly conducting screen separating two identical or contrasting half-space regions. The moment solution uses sets of properly shifted and modulated Gaussian elementary beams to expand the unknown equivalent magnetic current and a simple point-matching procedure for testing. The Gaussian expansion offers a numerical advantage in subsequent field calculations. Instead of integrating over surface currents when computing the fields, the proposed expansion allows the evaluation of the fields by summations of analytic terms exploiting the simple and well-understood propagation features of Gaussian beams. Sample computations are given and compared with a standard pulse-pulse Galerkin solution
  • Keywords
    electromagnetic compatibility; electromagnetic field theory; electromagnetic interference; electromagnetic waves; shielding; Gaussian beam expansion; electromagnetic compatibility; electromagnetic coupling; electromagnetic interference; equivalent magnetic current; half-space regions; infinitesimally thin screen; method of moments analysis; perfectly conducting screen; point-matching procedure; slots; transverse electric coupling; Beams; EMP radiation effects; Electromagnetic analysis; Electromagnetic coupling; Equations; Magnetic separation; Matrices; Moment methods; Tellurium; Testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.45095
  • Filename
    45095