Title :
High-voltage pulsed life for multistressed polypropylene capacitor dielectric
Author :
Laghari, Javaid R.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fDate :
2/1/1992 12:00:00 AM
Abstract :
High-voltage polypropylene capacitors were aged under singular as well as simultaneous multiple stresses (electrical, thermal, and radiation) at the University at Buffalo´s 2-MW thermal nuclear reactor. These stresses were combined neutron-gamma radiation with a total dose of 1.6×106 rad, electrical stress at 40 Vrms/μm, and thermal stress at 90°C. After exposure, the polypropylene dielectric was tested for life (number of pulses to fail) under high-voltage high-repetition-rate (100 pps) pulses. Pulsed life data were also compared with AC life data. Results show that radiation stress causes the most degradation in life, either acting alone or in combination with other stresses
Keywords :
ageing; electron device testing; gamma-ray effects; high-voltage techniques; life testing; neutron effects; polymers; power capacitors; thermal stresses; 90 degC; AC life; HV high repetition pulses; HV polypropylene capacitors; HV pulsed life; ageing; electrical stress; gamma irradiation; multistressed polypropylene capacitor dielectric; neutron irradiation; radiation stress; simultaneous multiple stresses; thermal stress; Aging; Capacitors; Dielectrics; Nuclear power generation; Power system dynamics; Pulse power systems; Thermal degradation; Thermal management; Thermal stresses; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
