• DocumentCode
    1209805
  • Title

    Crack tip behavior under pulsed electromagnetic loading

  • Author

    Satapathy, Sikhanda ; Stefani, Francis ; Saenz, Aaron

  • Author_Institution
    Inst. for Adv. Technol., Univ. of Texas, Austin, TX, USA
  • Volume
    41
  • Issue
    1
  • fYear
    2005
  • Firstpage
    226
  • Lastpage
    230
  • Abstract
    This paper describes a series of experiments and their numerical simulations in which cracks were created in conductors by using high-transient magnetic fields. The tests were conducted on small samples of 7075 aluminum alloy in a test fixture that placed the samples in series with a high-voltage capacitor bank and constrained the samples from moving. Notches were machined in the samples at various depths for the purpose of creating an initiation site for the cracks. After each pulse, the samples were unmounted and examined under an optical microscope. The peak current was varied to examine its effect on crack tip behavior. It was found that the crack tip extended linearly, was blunted by cavitation (blowholes formed due to intense heating), or bifurcated-depending on the level of the peak current. Multiple pulses were also applied to one sample to study the effects of repeated pulsing on crack extension. Finite-element computations were performed using the three-dimensional finite-element analysis program EMAP3D in conjunction with the stress code DYNA3D. The computational results confirm most of the features observed in the experiments.
  • Keywords
    aluminium alloys; conductors (electric); crack-edge stress field analysis; electromagnetic fields; finite element analysis; 7075 aluminum alloy; DYNA3D; EMAP3D; cavitation; crack bifurcation; crack propagation; crack tip behavior; crack tip heating; electromagnetic pulse; finite-element analysis; high-transient magnetic fields; high-voltage capacitor bank; optical microscope; pulsed electromagnetic loading; Aluminum alloys; Conductors; EMP radiation effects; Finite element methods; Fixtures; Magnetic fields; Numerical simulation; Optical microscopy; Optical pulses; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2004.838743
  • Filename
    1381542