DocumentCode
1209805
Title
Crack tip behavior under pulsed electromagnetic loading
Author
Satapathy, Sikhanda ; Stefani, Francis ; Saenz, Aaron
Author_Institution
Inst. for Adv. Technol., Univ. of Texas, Austin, TX, USA
Volume
41
Issue
1
fYear
2005
Firstpage
226
Lastpage
230
Abstract
This paper describes a series of experiments and their numerical simulations in which cracks were created in conductors by using high-transient magnetic fields. The tests were conducted on small samples of 7075 aluminum alloy in a test fixture that placed the samples in series with a high-voltage capacitor bank and constrained the samples from moving. Notches were machined in the samples at various depths for the purpose of creating an initiation site for the cracks. After each pulse, the samples were unmounted and examined under an optical microscope. The peak current was varied to examine its effect on crack tip behavior. It was found that the crack tip extended linearly, was blunted by cavitation (blowholes formed due to intense heating), or bifurcated-depending on the level of the peak current. Multiple pulses were also applied to one sample to study the effects of repeated pulsing on crack extension. Finite-element computations were performed using the three-dimensional finite-element analysis program EMAP3D in conjunction with the stress code DYNA3D. The computational results confirm most of the features observed in the experiments.
Keywords
aluminium alloys; conductors (electric); crack-edge stress field analysis; electromagnetic fields; finite element analysis; 7075 aluminum alloy; DYNA3D; EMAP3D; cavitation; crack bifurcation; crack propagation; crack tip behavior; crack tip heating; electromagnetic pulse; finite-element analysis; high-transient magnetic fields; high-voltage capacitor bank; optical microscope; pulsed electromagnetic loading; Aluminum alloys; Conductors; EMP radiation effects; Finite element methods; Fixtures; Magnetic fields; Numerical simulation; Optical microscopy; Optical pulses; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.838743
Filename
1381542
Link To Document